Complete solutions from INGUN
When ever there is talk of testing, we have the right solution - from the standard Test Probe through to the complete Test System.

Our testing strategies:

MDA Test Systems
Production defects have no chance Missing components, shorts, opens, badly or nonsoldered components: the MDA Test System identifies defects quickly and reliably. Resistors, capacitors, inductors, diodes and transistors are measured in milliseconds. The main features of the MDA Test System from INGUN are the testing speed and high-level process capability. No programming knowledge is required for the operating of the Test System. Simple enhancement is possible due to the modular design.

Functional Test System
The right solution for each case Universal usage and cost-effective: our Functional Test Systems have an open, modular hard and software structure, both of which are perfectly matched up to each other. All necessary components are put together in a fast and efficient way to create a reliable Test System. And due to the high level of flexibility, our solutions can be used in numerous fields of technology.

Combi Test System
With strategy to the ideal test coverage The combinational test combines all the possibilities of the MDA and the FCT tests and therefore offers a much higher test coverage. The fast MDA test is used prior to the FCT test. Production defects are recognised quickly and precise, defect devices can be sorted out immediately. Should the system not have recognised a defect during the MDA test, then the PC-Boards undergo a thorough functional test. This mixed test strategy helps to save valuable testing time, because only those PC-Boards which have no production defects are tested functionally.